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Characterisation of electrically active defects
Ray Duffy
, Anco Heringa
Tyndall
Tyndall MicroNano Systems
NXP Semiconductors
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Engineering
Power Supply
100%
Device Performance
100%
Induced Defect
100%
Activation Energy
100%
Ideality Factor
100%
Carrier Lifetime
100%
Optimized Process
100%
Material Science
Electronic Circuit
100%
Density
100%
Transistor
100%
Activation Energy
100%
Carrier Lifetime
100%