Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

Vyacheslav Kachkanov; Igor Dolbnya; Kevin O'Donnell; Katharina Lorenz; Sergio Pereira; Ian Watson; Thomas Sadler; Haoning Li; Vitaly Zubialevich; Peter Parbrook

doi:10.1002/pssc.201200596

Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

Vyacheslav Kachkanov
, Igor Dolbnya
, Kevin O'Donnell
, Katharina Lorenz
, Sergio Pereira
, Ian Watson
, Thomas Sadler
, Haoning Li
, Vitaly Zubialevich
, Peter Parbrook

Diamond Light Source
University of Strathclyde
Instituto Tecnológico e Nuclear
University of Aveiro

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.

Original language	English
Pages (from-to)	481-485
Number of pages	5
Journal	Physica Status Solidi (C) Current Topics in Solid State Physics
Volume	10
Issue number	3
DOIs	https://doi.org/10.1002/pssc.201200596
Publication status	Published - Mar 2013

Keywords

Nitride materials
Reciprocal space mapping
Synchrotron radiation
X-ray microdiffraction

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10.1002/pssc.201200596

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abstract = "X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.",

keywords = "Nitride materials, Reciprocal space mapping, Synchrotron radiation, X-ray microdiffraction",

author = "Vyacheslav Kachkanov and Igor Dolbnya and Kevin O'Donnell and Katharina Lorenz and Sergio Pereira and Ian Watson and Thomas Sadler and Haoning Li and Vitaly Zubialevich and Peter Parbrook",

year = "2013",

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doi = "10.1002/pssc.201200596",

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T1 - Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

AU - Kachkanov, Vyacheslav

AU - Dolbnya, Igor

AU - O'Donnell, Kevin

AU - Lorenz, Katharina

AU - Pereira, Sergio

AU - Watson, Ian

AU - Sadler, Thomas

AU - Li, Haoning

AU - Zubialevich, Vitaly

AU - Parbrook, Peter

PY - 2013/3

Y1 - 2013/3

N2 - X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.

AB - X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.

KW - Nitride materials

KW - Reciprocal space mapping

KW - Synchrotron radiation

KW - X-ray microdiffraction

UR - https://www.scopus.com/pages/publications/84874986523

U2 - 10.1002/pssc.201200596

DO - 10.1002/pssc.201200596

M3 - Article

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SN - 1862-6351

VL - 10

SP - 481

EP - 485

JO - Physica Status Solidi (C) Current Topics in Solid State Physics

JF - Physica Status Solidi (C) Current Topics in Solid State Physics

IS - 3

ER -

Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

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Keywords

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