TY - JOUR
T1 - Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping
AU - Kachkanov, Vyacheslav
AU - Dolbnya, Igor
AU - O'Donnell, Kevin
AU - Lorenz, Katharina
AU - Pereira, Sergio
AU - Watson, Ian
AU - Sadler, Thomas
AU - Li, Haoning
AU - Zubialevich, Vitaly
AU - Parbrook, Peter
PY - 2013/3
Y1 - 2013/3
N2 - X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.
AB - X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale.
KW - Nitride materials
KW - Reciprocal space mapping
KW - Synchrotron radiation
KW - X-ray microdiffraction
UR - https://www.scopus.com/pages/publications/84874986523
U2 - 10.1002/pssc.201200596
DO - 10.1002/pssc.201200596
M3 - Article
AN - SCOPUS:84874986523
SN - 1862-6351
VL - 10
SP - 481
EP - 485
JO - Physica Status Solidi (C) Current Topics in Solid State Physics
JF - Physica Status Solidi (C) Current Topics in Solid State Physics
IS - 3
ER -