Characterization of Interface Defects

P. Hurley; O. Engström; D. Bauza; G. Ghibaudo

doi:10.1002/9781118621523.ch15

Characterization of Interface Defects

P. Hurley
, O. Engström
, D. Bauza
, G. Ghibaudo

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

Original language	English
Title of host publication	Nanoscale CMOS
Subtitle of host publication	Innovative Materials, Modeling and Characterization
Publisher	John Wiley and Sons
Pages	545-573
Number of pages	29
ISBN (Print)	9781848211803
DOIs	https://doi.org/10.1002/9781118621523.ch15
Publication status	Published - 5 Mar 2013

Keywords

C-V response
Charge pumping
Interface defect
LF noise
Low frequency noise

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10.1002/9781118621523.ch15

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title = "Characterization of Interface Defects",

keywords = "C-V response, Charge pumping, Interface defect, LF noise, Low frequency noise",

author = "P. Hurley and O. Engstr{\"o}m and D. Bauza and G. Ghibaudo",

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T1 - Characterization of Interface Defects

AU - Hurley, P.

AU - Engström, O.

AU - Bauza, D.

AU - Ghibaudo, G.

PY - 2013/3/5

Y1 - 2013/3/5

KW - C-V response

KW - Charge pumping

KW - Interface defect

KW - LF noise

KW - Low frequency noise

UR - https://www.scopus.com/pages/publications/84886349999

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SN - 9781848211803

SP - 545

EP - 573

BT - Nanoscale CMOS

PB - John Wiley and Sons

ER -

Characterization of Interface Defects

Keywords

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