Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI

Michael Schmidt

doi:10.1017/s1431927622009138

Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI

Michael Schmidt

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/s1431927622009138
Publication status	Published - 2022

Keywords

Aurivillius
Multiferroics
Materials science
Characterization (materials science)
Phase (matter)
Ferroelectricity
Content (measure theory)
Nanotechnology
Optoelectronics
Physics
Mathematical analysis
Mathematics
Dielectric
Quantum mechanics

Access to Document

10.1017/s1431927622009138

https://openalex.org/W4286716976Licence: CC BY-NC-ND

Cite this

@article{1dbf80171c65483790840caea0f4847f,

title = "Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI",

keywords = "Aurivillius, Multiferroics, Materials science, Characterization (materials science), Phase (matter), Ferroelectricity, Content (measure theory), Nanotechnology, Optoelectronics, Physics, Mathematical analysis, Mathematics, Dielectric, Quantum mechanics",

author = "Michael Schmidt",

year = "2022",

doi = "10.1017/s1431927622009138",

language = "English",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI

AU - Schmidt, Michael

PY - 2022

Y1 - 2022

KW - Aurivillius

KW - Multiferroics

KW - Materials science

KW - Characterization (materials science)

KW - Phase (matter)

KW - Ferroelectricity

KW - Content (measure theory)

KW - Nanotechnology

KW - Optoelectronics

KW - Physics

KW - Mathematical analysis

KW - Mathematics

KW - Dielectric

KW - Quantum mechanics

U2 - 10.1017/s1431927622009138

DO - 10.1017/s1431927622009138

M3 - Article

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -