@inproceedings{dcb1da2acf2c4e0b8e1a299cd10691af,
title = "Characterization of resistivity of Sb2S3 semiconductor nanowires by conductive AFM and in situ methods",
abstract = "Conductive AFM and in situ methods were used to determine contact resistance and resistivity of individual Sb2S3 nanowires. Nanowires were deposited on oxidized Si surface for in situ measurements and on Si surface with macroelectrodes for conductive AFM (C-AFM) measurements. Contact resistance was determined by measurement of I(V) characteristics at different distances from the nanowire contact with the macroelectrode and resistivity of nanowires was determined. Sb2S3 is a soft material with low adhesion force to the surface and therefore special precautions were taken during measurements.",
keywords = "Conductive AFM, Nanowires, Resistivity, SbS",
author = "Janis Bukins and Gunta Kunakova and Pavels Birjukovs and Juris Prikulis and Justin Varghese and Holmes, \{J. D.\} and Donats Erts",
year = "2011",
doi = "10.4028/www.scientific.net/AMR.222.106",
language = "English",
isbn = "9783037850879",
series = "Advanced Materials Research",
pages = "106--109",
booktitle = "Global Research and Education",
note = "9th International Conference on Global Research and Education, INTER-ACADEMIA 2010 ; Conference date: 09-08-2010 Through 12-08-2010",
}