Characterization of the failure site distribution in MIM devices using zoomed wavelet analysis

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Journal of Electronic Materials
DOIs	https://doi.org/10.1007/S11664-018-6298-2
Publication status	Published - 2018

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@article{33e59c22981a4a40bcbaceecd28abebd,

title = "Characterization of the failure site distribution in MIM devices using zoomed wavelet analysis",

author = "Ailbe O'Manachain",

year = "2018",

doi = "10.1007/S11664-018-6298-2",

language = "Undefined/Unknown",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer New York",

}