Charge Trapping Characterization of LaLuO3/p-Si Interfaces at Cryogenic Temperatures

Igor Petrovitch Tyagulskyy; Stanislav Igorovitch Tiagulskyi; Aleksey Nickolaevitch Nazarov; Vladimir Sergeevitch Lysenko; PK Hurley; K Cherkaoui; S Monaghan

Charge Trapping Characterization of LaLuO3/p-Si Interfaces at Cryogenic Temperatures

Igor Petrovitch Tyagulskyy
, Stanislav Igorovitch Tiagulskyi
, Aleksey Nickolaevitch Nazarov
, Vladimir Sergeevitch Lysenko
, PK Hurley
, K Cherkaoui
, S Monaghan

Tyndall MicroNano Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Electrochemical Society Transactions 225
Publication status	Published - 2014

Cite this

@article{c7d7a69da62e4963ba20d5962035089c,

title = "Charge Trapping Characterization of LaLuO3/p-Si Interfaces at Cryogenic Temperatures",

author = "Tyagulskyy, \{Igor Petrovitch\} and Tiagulskyi, \{Stanislav Igorovitch\} and Nazarov, \{Aleksey Nickolaevitch\} and Lysenko, \{Vladimir Sergeevitch\} and PK Hurley and K Cherkaoui and S Monaghan",

year = "2014",

language = "Undefined/Unknown",

journal = "Electrochemical Society Transactions 225",

}

TY - JOUR

T1 - Charge Trapping Characterization of LaLuO3/p-Si Interfaces at Cryogenic Temperatures

AU - Tyagulskyy, Igor Petrovitch

AU - Tiagulskyi, Stanislav Igorovitch

AU - Nazarov, Aleksey Nickolaevitch

AU - Lysenko, Vladimir Sergeevitch

AU - Hurley, PK

AU - Cherkaoui, K

AU - Monaghan, S

PY - 2014

Y1 - 2014

M3 - Article

JO - Electrochemical Society Transactions 225

JF - Electrochemical Society Transactions 225

ER -