@article{ef91de63d86c42dc9368040a5549cd7a,
title = "Charge Trapping Characterization of LaLuO3/p-Si Interfaces at Cryogenic Temperatures",
keywords = "Materials science, Dielectric, Amorphous solid, Ternary operation, Isothermal process, Gate dielectric, Substrate (aquarium), Optoelectronics, High-{\^I}º dielectric, Gate oxide, Analytical Chemistry (journal), Transistor, Chemistry, Electrical engineering, Voltage, Crystallography, Physics, Oceanography, Chromatography, Geology, Computer science, Thermodynamics, Programming language, Engineering",
author = "Paul Hurley",
year = "2014",
doi = "10.1149/ma2014-01/36/1390",
language = "English",
journal = "Meeting Abstracts",
issn = "1091-8213",
}