Abstract
Electrically injected, edge-emitting cleaved-facet violet laser diodes were realized using a 480 nm thick lattice matched Si doped Al0.82 In0.18 N/GaN multilayer as the cladding on the n-side of the waveguide. Far-field measurements verify strong mode confinement to the waveguide. An extra voltage is measured and investigated using separate mesa structures with a single AlInN insertion. This showed that the electron current has a small thermally activated shunt resistance with a barrier of 0.135 eV and a current which scales according to Vn, where n∼3 at current densities appropriate to laser operation.
| Original language | English |
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| Article number | 201112 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 16 May 2011 |