CMOS device optimization for mixed-signal technologies

P. A. Stolk; H. P. Tuinhout; R. Duffy; E. Augendre; L. P. Bellefroid; M. J.B. Bolt; J. Croon; C. J.J. Dachs; F. R.J. Huisman; A. J. Moonen; Y. V. Ponomarev; R. F.M. Roes; M. Da Rold; E. Seevinck; K. N. Sreerambhatla; R. Surdeanu; R. M.D.A. Velghe; M. Vertregt; M. N. Webster; N. K.J. Van Winkelhoff; A. T.A. Zegers-Van Duijnhoven

doi:10.1109/IEDM.2001.979469

CMOS device optimization for mixed-signal technologies

P. A. Stolk
, H. P. Tuinhout
, R. Duffy
, E. Augendre
, L. P. Bellefroid
, M. J.B. Bolt
, J. Croon
, C. J.J. Dachs
, F. R.J. Huisman
, A. J. Moonen
, Y. V. Ponomarev
, R. F.M. Roes
, M. Da Rold
, E. Seevinck
, K. N. Sreerambhatla
, R. Surdeanu
, R. M.D.A. Velghe
, M. Vertregt
, M. N. Webster
, N. K.J. Van Winkelhoff

A. T.A. Zegers-Van Duijnhoven

Research output: Contribution to journal › Article › peer-review

Abstract

This paper studies the suitability of CMOS device technology for mixed-signal applications. The currently proposed scaling scenario's for CMOS technologies lead to strong degradation of analog transistor performance. As a result, the combined optimization of digital and analog devices for system-on-a-chip applications will require increasingly elaborate process modifications. New device solutions such as metal gate integration and asymmetric (source-side-only) workfunction modification offer process options for future mixed-signal CMOS applications.

Original language	English
Pages (from-to)	215-218
Number of pages	4
Journal	Technical Digest - International Electron Devices Meeting
DOIs	https://doi.org/10.1109/IEDM.2001.979469
Publication status	Published - 2001
Externally published	Yes

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Stolk, P. A., Tuinhout, H. P., Duffy, R., Augendre, E., Bellefroid, L. P., Bolt, M. J. B., Croon, J., Dachs, C. J. J., Huisman, F. R. J., Moonen, A. J., Ponomarev, Y. V., Roes, R. F. M., Da Rold, M., Seevinck, E., Sreerambhatla, K. N., Surdeanu, R., Velghe, R. M. D. A., Vertregt, M., Webster, M. N., ... Zegers-Van Duijnhoven, A. T. A. (2001). CMOS device optimization for mixed-signal technologies. Technical Digest - International Electron Devices Meeting, 215-218. https://doi.org/10.1109/IEDM.2001.979469

@article{da649bc4532a490a9e5a877edc674999,

title = "CMOS device optimization for mixed-signal technologies",

abstract = "This paper studies the suitability of CMOS device technology for mixed-signal applications. The currently proposed scaling scenario's for CMOS technologies lead to strong degradation of analog transistor performance. As a result, the combined optimization of digital and analog devices for system-on-a-chip applications will require increasingly elaborate process modifications. New device solutions such as metal gate integration and asymmetric (source-side-only) workfunction modification offer process options for future mixed-signal CMOS applications.",

author = "Stolk, \{P. A.\} and Tuinhout, \{H. P.\} and R. Duffy and E. Augendre and Bellefroid, \{L. P.\} and Bolt, \{M. J.B.\} and J. Croon and Dachs, \{C. J.J.\} and Huisman, \{F. R.J.\} and Moonen, \{A. J.\} and Ponomarev, \{Y. V.\} and Roes, \{R. F.M.\} and \{Da Rold\}, M. and E. Seevinck and Sreerambhatla, \{K. N.\} and R. Surdeanu and Velghe, \{R. M.D.A.\} and M. Vertregt and Webster, \{M. N.\} and \{Van Winkelhoff\}, \{N. K.J.\} and \{Zegers-Van Duijnhoven\}, \{A. T.A.\}",

year = "2001",

doi = "10.1109/IEDM.2001.979469",

language = "English",

pages = "215--218",

journal = "Technical Digest - International Electron Devices Meeting",

issn = "0163-1918",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

Stolk, PA, Tuinhout, HP, Duffy, R, Augendre, E, Bellefroid, LP, Bolt, MJB, Croon, J, Dachs, CJJ, Huisman, FRJ, Moonen, AJ, Ponomarev, YV, Roes, RFM, Da Rold, M, Seevinck, E, Sreerambhatla, KN, Surdeanu, R, Velghe, RMDA, Vertregt, M, Webster, MN, Van Winkelhoff, NKJ & Zegers-Van Duijnhoven, ATA 2001, 'CMOS device optimization for mixed-signal technologies', Technical Digest - International Electron Devices Meeting, pp. 215-218. https://doi.org/10.1109/IEDM.2001.979469

TY - JOUR

T1 - CMOS device optimization for mixed-signal technologies

AU - Stolk, P. A.

AU - Tuinhout, H. P.

AU - Duffy, R.

AU - Augendre, E.

AU - Bellefroid, L. P.

AU - Bolt, M. J.B.

AU - Croon, J.

AU - Dachs, C. J.J.

AU - Huisman, F. R.J.

AU - Moonen, A. J.

AU - Ponomarev, Y. V.

AU - Roes, R. F.M.

AU - Da Rold, M.

AU - Seevinck, E.

AU - Sreerambhatla, K. N.

AU - Surdeanu, R.

AU - Velghe, R. M.D.A.

AU - Vertregt, M.

AU - Webster, M. N.

AU - Van Winkelhoff, N. K.J.

AU - Zegers-Van Duijnhoven, A. T.A.

PY - 2001

Y1 - 2001

N2 - This paper studies the suitability of CMOS device technology for mixed-signal applications. The currently proposed scaling scenario's for CMOS technologies lead to strong degradation of analog transistor performance. As a result, the combined optimization of digital and analog devices for system-on-a-chip applications will require increasingly elaborate process modifications. New device solutions such as metal gate integration and asymmetric (source-side-only) workfunction modification offer process options for future mixed-signal CMOS applications.

AB - This paper studies the suitability of CMOS device technology for mixed-signal applications. The currently proposed scaling scenario's for CMOS technologies lead to strong degradation of analog transistor performance. As a result, the combined optimization of digital and analog devices for system-on-a-chip applications will require increasingly elaborate process modifications. New device solutions such as metal gate integration and asymmetric (source-side-only) workfunction modification offer process options for future mixed-signal CMOS applications.

UR - https://www.scopus.com/pages/publications/17944400303

U2 - 10.1109/IEDM.2001.979469

DO - 10.1109/IEDM.2001.979469

M3 - Article

AN - SCOPUS:17944400303

SN - 0163-1918

SP - 215

EP - 218

JO - Technical Digest - International Electron Devices Meeting

JF - Technical Digest - International Electron Devices Meeting

ER -

CMOS device optimization for mixed-signal technologies

Abstract

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