Co-based amorphous thin films on silicon with soft magnetic properties

Ansar Masood; P. McCloskey; Cian Mathúna; S. Kulkarni

doi:10.1063/1.5007733

Co-based amorphous thin films on silicon with soft magnetic properties

Ansar Masood
, P. McCloskey
, Cian Mathúna
, S. Kulkarni

Tyndall IPES (Integrated Power)

University College Cork

Research output: Contribution to journal › Article › peer-review

Abstract

The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.

Original language	English
Article number	056109
Journal	AIP Advances
Volume	8
Issue number	5
DOIs	https://doi.org/10.1063/1.5007733
Publication status	Published - 1 May 2018

Access to Document

10.1063/1.5007733

Cite this

@article{7fdbcfcfbed949f883e5f421392500d8,

title = "Co-based amorphous thin films on silicon with soft magnetic properties",

abstract = "The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.",

author = "Ansar Masood and P. McCloskey and Cian Math{\'u}na and S. Kulkarni",

note = "Publisher Copyright: {\textcopyright} 2017 Author(s).",

year = "2018",

month = may,

day = "1",

doi = "10.1063/1.5007733",

language = "English",

volume = "8",

journal = "AIP Advances",

issn = "2158-3226",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Co-based amorphous thin films on silicon with soft magnetic properties

AU - Masood, Ansar

AU - McCloskey, P.

AU - Mathúna, Cian

AU - Kulkarni, S.

PY - 2018/5/1

Y1 - 2018/5/1

N2 - The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.

AB - The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.

UR - https://www.scopus.com/pages/publications/85038971033

U2 - 10.1063/1.5007733

DO - 10.1063/1.5007733

M3 - Article

AN - SCOPUS:85038971033

SN - 2158-3226

VL - 8

JO - AIP Advances

JF - AIP Advances

IS - 5

M1 - 056109

ER -

Co-based amorphous thin films on silicon with soft magnetic properties

Abstract

Access to Document

Other files and links

Fingerprint

Cite this