Abstract
X-ray diffraction, second-harmonic generation and infrared reflectance investigations reveal no evidence for a polar phase or ferroelectric phase transition in 1.6% tensile strained anatase TiO2 thin films. This indicates that the previously-reported potential ferroelectric behaviour, observed using piezoelectric force microscopy, may have been defect related, or the polar distortion is too small to detect using these methods.
| Original language | English |
|---|---|
| Pages (from-to) | 642-646 |
| Number of pages | 5 |
| Journal | Advanced Functional Materials |
| Volume | 26 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2 Feb 2016 |
Keywords
- ferroelectricity
- IR spectroscopy
- phonons
- SHG
- TiO anatase
- XRD
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