Abstract
A compact model development for a new nonvolatile memory cell architecture is discussed. The model is based on the physical structure of the device and allows an insight into the device operation. It is shown that the model is accurate over the full range operation of the cell.
| Original language | English |
|---|---|
| Pages (from-to) | 215-219 |
| Number of pages | 5 |
| Journal | IEEE Transactions on Semiconductor Manufacturing |
| Volume | 16 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - May 2003 |
Keywords
- Memories
- Modeling
- Silicon
Fingerprint
Dive into the research topics of 'Compact model development for a new nonvolatile memory cell architecture'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver