Correlation between optical properties and interface morphology of GaAsAlGaAs quantum wells

  • N. Moret
  • , D. Y. Oberli
  • , E. Pelucchi
  • , N. Gogneau
  • , A. Rudra
  • , E. Kapon

Research output: Contribution to journalArticlepeer-review

Abstract

We investigate the embedded interfaces of GaAsAlGaAs quantum wells grown by metal organic vapor phase epitaxy on slightly (<1°) -misoriented (001) substrates using selective etching and atomic force microscopy. Depending on the substrate misorientation, we observe different growth modes at the embedded interfaces, which are directly correlated to the photoluminescence linewidth. We show that the narrowest linewidth is obtained on 0.2°-off (001) substrates for which the heterointerfaces consist of atomically smooth narrow terraces.

Original languageEnglish
Article number141917
JournalApplied Physics Letters
Volume88
Issue number14
DOIs
Publication statusPublished - 3 Apr 2006
Externally publishedYes

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