Correlation of shear stress and metal shift: a modeling approach

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Abstract

This paper uses three dimensional finite element methods to determine the thermo-mechanically induced encapsulation stress in a 160 lead plastic quad flat pack. Comparisons are made between the effects of different leadframe materials on die stress. The degree of discretization of the leadframe necessary to accurately model it's effect on die stress is determined. A strong correlation between metal shift and out of plane shear stress is proposed following comparisons of F.E. package modeling and experimentally measured metal shift patterns on specially developed test die.

Original languageEnglish
Title of host publicationProceedings - Electronic Components and Technology Conference
PublisherPubl by IEEE
Pages264-269
Number of pages6
ISBN (Print)0780307941
Publication statusPublished - 1993
Event1993 Proceedings of the 43rd Electronic Components and Technology Conference - Orlando, FL, USA
Duration: 1 Jun 19934 Jun 1993

Publication series

NameProceedings - Electronic Components and Technology Conference
ISSN (Print)0569-5503

Conference

Conference1993 Proceedings of the 43rd Electronic Components and Technology Conference
CityOrlando, FL, USA
Period1/06/934/06/93

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