Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronic Engineering
DOIs	https://doi.org/10.1016/J.MEE.2019.111023
Publication status	Published - 2019

Access to Document

@article{0d8399e9f9dc40ce85002f461cc68284,

title = "Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices",

author = "Ailbe O'Manachain",

year = "2019",

doi = "10.1016/J.MEE.2019.111023",

language = "Undefined/Unknown",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier B.V.",

}