Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronic Engineering
Publication status	Published - 2019

Cite this

@article{eb0aead31e504668bc614d42ef40b290,

title = "Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices",

author = "J Mu{\~n}oz-Gorriz and Scott Monaghan and Karim Cherkaoui and Jordi Su{\~n}{\'e} and Hurley, \{Paul K\} and Enrique Miranda",

year = "2019",

language = "Undefined/Unknown",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier B.V.",

}