TY - CHAP
T1 - Detection of seizures in intracranial EEG
T2 - 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
AU - Temko, Andriy
AU - Sarkar, Achintya
AU - Lightbody, Gordon
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/4
Y1 - 2015/11/4
N2 - A system for detection of seizures in intracranial EEG is presented that is based on a combination of generative, discriminative and hybrid approaches. We present a methodology to effectively benefit from the advantages each classifier offers. In particular, Gaussian mixture models, Support Vector Machines, hybrid likelihood ratio and Gaussian supervector approaches are developed and combined for the task. This system participated in the UPenn and Mayo Clinic's Seizure Detection Challenge, ranking in the top 5 of over 200 participants. The drawbacks of the proposed method with respect to the winning solutions are critically assessed.
AB - A system for detection of seizures in intracranial EEG is presented that is based on a combination of generative, discriminative and hybrid approaches. We present a methodology to effectively benefit from the advantages each classifier offers. In particular, Gaussian mixture models, Support Vector Machines, hybrid likelihood ratio and Gaussian supervector approaches are developed and combined for the task. This system participated in the UPenn and Mayo Clinic's Seizure Detection Challenge, ranking in the top 5 of over 200 participants. The drawbacks of the proposed method with respect to the winning solutions are critically assessed.
UR - https://www.scopus.com/pages/publications/84953295920
U2 - 10.1109/EMBC.2015.7319901
DO - 10.1109/EMBC.2015.7319901
M3 - Chapter
C2 - 26737801
AN - SCOPUS:84953295920
T3 - Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
SP - 6582
EP - 6585
BT - 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 August 2015 through 29 August 2015
ER -