Fingerprint
Dive into the research topics of 'Determination of physical parameters for HfO2/SiO x/TiN MOSFET gate stacks by electrical characterization and reverse modeling'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Determination of physical parameters for HfO2/SiO x/TiN MOSFET gate stacks by electrical characterization and reverse modeling
- S. Monaghan
- , P. K. Hurley
- , K. Cherkaoui
- , M. A. Negara
- , A. Schenk
Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review