Dimensional and defectivity nanometrology of directed self-assembly patterns
- C. Simão
- , D. Tuchapsky
- , W. Khunsin
- , A. Amann
- , M. A. Morris
- , C. M.Sotomayor Torres
- Autonomous University of Barcelona
- Imperial College London
- Trinity College Dublin
- ICREA
Research output: Contribution to journal › Article › peer-review