Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0. 53Ga0. 47As capacitors

Ailbe O'Manachain

doi:10.1116/1.4774109

Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0. 53Ga0. 47As capacitors

Ailbe O'Manachain

Tyndall MicroNano Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOIs	https://doi.org/10.1116/1.4774109
Publication status	Published - 2013

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10.1116/1.4774109

Cite this

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title = "Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0. 53Ga0. 47As capacitors",

author = "Ailbe O'Manachain",

year = "2013",

doi = "10.1116/1.4774109",

language = "Undefined/Unknown",

journal = "Journal of Vacuum Science \& Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena",

}

Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0. 53Ga0. 47As capacitors. / O'Manachain, Ailbe.
In: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2013.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0. 53Ga0. 47As capacitors

AU - O'Manachain, Ailbe

PY - 2013

Y1 - 2013

U2 - 10.1116/1.4774109

DO - 10.1116/1.4774109

M3 - Article

JO - Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

JF - Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

ER -