Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/J.MICROREL.2009.06.017
Publication status	Published - 2009

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@article{4571cd966bf740dba26c7a314a13e660,

title = "Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks",

author = "Ailbe O'Manachain",

year = "2009",

doi = "10.1016/J.MICROREL.2009.06.017",

language = "Undefined/Unknown",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}