Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

Enrique Miranda; Javier Mart́ın-Mart́ınez; Eamon O’Connor; G Hughes; P Casey; Karim Cherkaoui; S Monaghan; R Long; D O’Connell; Paul K Hurley

Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

Enrique Miranda
, Javier Mart́ın-Mart́ınez
, Eamon O’Connor
, G Hughes
, P Casey
, Karim Cherkaoui
, S Monaghan
, R Long
, D O’Connell
, Paul K Hurley

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronics Reliability
Publication status	Published - 2009

Cite this

@article{d13fb829ca7947088c9fbbbc59704399,

title = "Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks",

author = "Enrique Miranda and Javier Mar{\'t}ın-Mar{\'t}ınez and Eamon O{\textquoteright}Connor and G Hughes and P Casey and Karim Cherkaoui and S Monaghan and R Long and D O{\textquoteright}Connell and Hurley, \{Paul K\}",

year = "2009",

language = "Undefined/Unknown",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

AU - Miranda, Enrique

AU - Mart́ın-Mart́ınez, Javier

AU - O’Connor, Eamon

AU - Hughes, G

AU - Casey, P

AU - Cherkaoui, Karim

AU - Monaghan, S

AU - Long, R

AU - O’Connell, D

AU - Hurley, Paul K

PY - 2009

Y1 - 2009

M3 - Article

SN - 0026-2714

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -