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Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks
- E. Miranda
- , J. Martin-Martinez
- , E. O'Connor
- , G. Hughes
- , P. Casey
- , K. Cherkaoui
- , S. Monaghan
- , R. Long
- , D. O'Connell
- , P. K. Hurley
Research output: Contribution to journal › Article › peer-review