Skip to main navigation Skip to search Skip to main content

Effects of the Semiconductor Substrate Material on the Post-Breakdown Current of MgO Dielectric Layers

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Original languageEnglish
Title of host publicationPhysics And Technology Of High-k Gate Dielectrics 7
EditorsS Kar, M Houssa, S VanElshocht, D Landheer
Pages79-86
Number of pages8
DOIs
Publication statusPublished - 2009

Cite this