Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies

Wim Vanderbauwhede; Erik Rombouts Rombouts; Zhenqiu Ning; Mamix Tack; Sharon Healy; Kevin McCarthy; Alan Mathewson

Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies

Wim Vanderbauwhede
, Erik Rombouts Rombouts
, Zhenqiu Ning
, Mamix Tack
, Sharon Healy
, Kevin McCarthy
, Alan Mathewson

School of Engineering and Architecture

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

Abstract

This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE model parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.

Original language	English
Title of host publication	ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference
Editors	R.P. Mertens, H. Grunbacher, H.E. Maes, G. Declerck
Publisher	IEEE Computer Society
Pages	468-471
Number of pages	4
ISBN (Electronic)	2863322451, 9782863322451
Publication status	Published - 1999
Event	29th European Solid-State Device Research Conference, ESSDERC 1999 - Leuven, Belgium Duration: 13 Sep 1999 → 15 Sep 1999

Publication series

Name	European Solid-State Device Research Conference
Volume	13-15 Sept. 1999
ISSN (Print)	1930-8876

Conference

Conference	29th European Solid-State Device Research Conference, ESSDERC 1999
Country/Territory	Belgium
City	Leuven
Period	13/09/99 → 15/09/99

Cite this

Vanderbauwhede, W., Rombouts, E. R., Ning, Z., Tack, M., Healy, S., McCarthy, K., & Mathewson, A. (1999). Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies. In R. P. Mertens, H. Grunbacher, H. E. Maes, & G. Declerck (Eds.), ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference (pp. 468-471). Article 1505547 (European Solid-State Device Research Conference; Vol. 13-15 Sept. 1999). IEEE Computer Society.

Vanderbauwhede, Wim ; Rombouts, Erik Rombouts ; Ning, Zhenqiu et al. / Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies. ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. editor / R.P. Mertens ; H. Grunbacher ; H.E. Maes ; G. Declerck. IEEE Computer Society, 1999. pp. 468-471 (European Solid-State Device Research Conference).

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title = "Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies",

abstract = "This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE model parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.",

author = "Wim Vanderbauwhede and Rombouts, \{Erik Rombouts\} and Zhenqiu Ning and Mamix Tack and Sharon Healy and Kevin McCarthy and Alan Mathewson",

year = "1999",

language = "English",

series = "European Solid-State Device Research Conference",

publisher = "IEEE Computer Society",

pages = "468--471",

editor = "R.P. Mertens and H. Grunbacher and H.E. Maes and G. Declerck",

booktitle = "ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference",

address = "United States",

note = "29th European Solid-State Device Research Conference, ESSDERC 1999 ; Conference date: 13-09-1999 Through 15-09-1999",

}

Vanderbauwhede, W, Rombouts, ER, Ning, Z, Tack, M, Healy, S, McCarthy, K & Mathewson, A 1999, Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies. in RP Mertens, H Grunbacher, HE Maes & G Declerck (eds), ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference., 1505547, European Solid-State Device Research Conference, vol. 13-15 Sept. 1999, IEEE Computer Society, pp. 468-471, 29th European Solid-State Device Research Conference, ESSDERC 1999, Leuven, Belgium, 13/09/99.

Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies. / Vanderbauwhede, Wim; Rombouts, Erik Rombouts; Ning, Zhenqiu et al.
ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. ed. / R.P. Mertens; H. Grunbacher; H.E. Maes; G. Declerck. IEEE Computer Society, 1999. p. 468-471 1505547 (European Solid-State Device Research Conference; Vol. 13-15 Sept. 1999).

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

TY - CHAP

T1 - Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies

AU - Vanderbauwhede, Wim

AU - Rombouts, Erik Rombouts

AU - Ning, Zhenqiu

AU - Tack, Mamix

AU - Healy, Sharon

AU - McCarthy, Kevin

AU - Mathewson, Alan

PY - 1999

Y1 - 1999

N2 - This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE model parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.

AB - This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE model parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.

UR - https://www.scopus.com/pages/publications/84907905763

M3 - Chapter

AN - SCOPUS:84907905763

T3 - European Solid-State Device Research Conference

SP - 468

EP - 471

BT - ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference

A2 - Mertens, R.P.

A2 - Grunbacher, H.

A2 - Maes, H.E.

A2 - Declerck, G.

PB - IEEE Computer Society

T2 - 29th European Solid-State Device Research Conference, ESSDERC 1999

Y2 - 13 September 1999 through 15 September 1999

ER -

Vanderbauwhede W, Rombouts ER, Ning Z, Tack M, Healy S, McCarthy K et al. Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies. In Mertens RP, Grunbacher H, Maes HE, Declerck G, editors, ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. IEEE Computer Society. 1999. p. 468-471. 1505547. (European Solid-State Device Research Conference).

Efficient methodologies for statistical characterisation of analogue designs for submicron CMOS Technologies

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