Electrical activity of extended defects in III-V semiconductors

  • E. Simoen
  • , P. C. Hsu
  • , Y. Mols
  • , B. Kunert
  • , R. Langer
  • , C. Merckling
  • , A. Alian
  • , N. Waldron
  • , G. Eneman
  • , N. Collaert
  • , M. Heyns
  • , C. Claeys

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

Fingerprint

Dive into the research topics of 'Electrical activity of extended defects in III-V semiconductors'. Together they form a unique fingerprint.

Material Science