Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy

  • Pavels Birjukovs
  • , Nikolay Petkov
  • , Ju Xu
  • , Janis Svirksts
  • , John J. Boland
  • , Justin D. Holmes
  • , Donats Erts

Research output: Contribution to journal › Article › peer-review

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