Electrical characterization of the soft breakdown failure mode in MgO layers

Enrique Miranda; Eamon O’Connor; Karim Cherkaoui; Scott Monaghan; R Long; Dan O’Connell; Paul K Hurley; Gregory Hughes; Patrick Casey

Electrical characterization of the soft breakdown failure mode in MgO layers

Enrique Miranda
, Eamon O’Connor
, Karim Cherkaoui
, Scott Monaghan
, R Long
, Dan O’Connell
, Paul K Hurley
, Gregory Hughes
, Patrick Casey

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Applied Physics Letters
Publication status	Published - 2009

Cite this

@article{fa21865fb41644c5bc088e34eb45c606,

title = "Electrical characterization of the soft breakdown failure mode in MgO layers",

author = "Enrique Miranda and Eamon O{\textquoteright}Connor and Karim Cherkaoui and Scott Monaghan and R Long and Dan O{\textquoteright}Connell and Hurley, \{Paul K\} and Gregory Hughes and Patrick Casey",

year = "2009",

language = "Undefined/Unknown",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Electrical characterization of the soft breakdown failure mode in MgO layers

AU - Miranda, Enrique

AU - O’Connor, Eamon

AU - Cherkaoui, Karim

AU - Monaghan, Scott

AU - Long, R

AU - O’Connell, Dan

AU - Hurley, Paul K

AU - Hughes, Gregory

AU - Casey, Patrick

PY - 2009

Y1 - 2009

M3 - Article

SN - 0003-6951

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -