Electrical characterization of the soft breakdown failure mode in MgO layers
- E. Miranda
- , E. O'Connor
- , K. Cherkaoui
- , S. Monaghan
- , R. Long
- , D. O'Connell
- , P. K. Hurley
- , G. Hughes
- , P. Casey
Research output: Contribution to journal › Article › peer-review