Electrical evaluation of defects at the Si(100)/HfO2 interface
- B. J. O'Sullivan
- , P. K. Hurley
- , E. O'Connor
- , M. Modreanu
- , H. Roussel
- , C. Jimenez
- , C. Dubourdieu
- , M. Audier
- , J. P. Sénateur
- Institut polytechnique de Grenoble
Research output: Contribution to journal › Article › peer-review