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Electrical performance of III-V gate-all-around nanowire transistors
Pedram Razavi
,
Giorgos Fagas
Tyndall
Tyndall Strategic Development
Research output
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peer-review
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Engineering
Confined Channel
25%
Current Drive
25%
Current Effect
25%
Electrical Performance
100%
Field-Effect Transistor
50%
Nanowire
100%
Silicon Device
25%
Transistor
100%
Tunnel Construction
25%
Material Science
Density
25%
Field Effect Transistor
50%
Nanowire
100%
Silicon
25%
Silicon Device
25%
Transistor
100%