Skip to main navigation Skip to search Skip to main content

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

  • C. Trager-Cowan
  • , F. Sweeney
  • , P. R. Edwards
  • , F. L. Dynowski
  • , A. J. Wilkinson
  • , A. Winkelmann
  • , A. P. Day
  • , T. Wang
  • , P. J. Parbrook
  • , I. M. Watson
  • , D. C. Joy
  • University of Strathclyde
  • University of Sheffield
  • University of Oxford
  • Max Planck Institute of Microstructure Physics
  • Aunt Daisy Scientific Ltd.
  • University of Tennessee

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1194-1195
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Aug 2008
Externally publishedYes

Cite this