Epitaxy of III-V based channels on Si and transistor integration for 12-10nm node CMOS

  • Matty Caymax
  • , Clement Merckling
  • , Gang Wang
  • , Tommaso Orzali
  • , Guo Weiming Guo
  • , Wilfried Vandervorst
  • , Johan Dekoster
  • , Niamh Waldron
  • , Aaron Thean

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Abstract

Moore's Law describes the scaling of Si-based CMOS technology in terms of performance, power consumption, area and cost. As we have reached the physical limits of scaling Si channels, alternative materials with higher carrier mobility such as Ge and IIIV compound semiconductors are in order. This paper reviews some of imec's work on introducing In0.53Ga0.47As in a manufacturable and integratable way into mainstream Si-based CMOS technology. Several major issues are known: dielectric/IIIV interface passivation, mismatch of lattice and crystal structure between IIIV and Si, small bandgap leading to enhanced leakage,... We will discuss mainly the epitaxial growth aspects and the integration of IIIV materials in Si MOSFET devices, and point out some more unexpected materials and device issues.

Original languageEnglish
Title of host publication2012 International Conference on Indium Phosphide and Related Materials, IPRM 2012
Pages159-162
Number of pages4
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 International Conference on Indium Phosphide and Related Materials, IPRM 2012 - Santa Barbara, CA, United States
Duration: 27 Aug 201230 Aug 2012

Publication series

NameConference Proceedings - International Conference on Indium Phosphide and Related Materials
ISSN (Print)1092-8669

Conference

Conference2012 International Conference on Indium Phosphide and Related Materials, IPRM 2012
Country/TerritoryUnited States
CitySanta Barbara, CA
Period27/08/1230/08/12

Keywords

  • CMOS
  • compound semiconductors

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