Equivalent oxide thickness correction in the high-k/In 0.53Ga0.47As/InP system
- P. K. Hurley
- , R. D. Long
- , T. O'Regan
- , É O'Connor
- , S. Monaghan
- , V. Djara
- , M. A. Negara
- , A. O'Mahony
- , I. M. Povey
- , A. Blake
- , R. E. Nagle
- , D. O'Connell
- , M. E. Pemble
- , K. Cherkaoui
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review