| Original language | Undefined/Unknown |
|---|---|
| Journal | Journal of the Electrochemical Society |
| Publication status | Published - 2012 |
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Erratum: Charged Defect Quantification in Pt/Al2O3/In0. 53Ga0. 47As/InP MOS Capacitors [J. Electrochem. Soc., 158, G103 (2011)]
Research output: Contribution to journal › Article › peer-review