Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011)

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Journal of the Electrochemical Society
DOIs	https://doi.org/10.1149/2.119206JES
Publication status	Published - 2012

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title = "Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011)",

author = "Long, \{R. D.\} and B. Shin and S. Monaghan and K. Cherkaoui and J. Cagnon and S. Stemmer and McIntyre, \{P. C.\} and Hurley, \{P. K.\}",

year = "2012",

doi = "10.1149/2.119206JES",

language = "Undefined/Unknown",

journal = "Journal of the Electrochemical Society",

issn = "0013-4651",

publisher = "Institute of Physics",

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T1 - Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011)

AU - Long, R. D.

AU - Shin, B.

AU - Monaghan, S.

AU - Cherkaoui, K.

AU - Cagnon, J.

AU - Stemmer, S.

AU - McIntyre, P. C.

AU - Hurley, P. K.

PY - 2012

Y1 - 2012

UR - https://publons.com/wos-op/publon/5992488/

U2 - 10.1149/2.119206JES

DO - 10.1149/2.119206JES

M3 - Article

SN - 0013-4651

JO - Journal of the Electrochemical Society

JF - Journal of the Electrochemical Society

ER -