Erratum: Electrical activity of extended defects in relaxed InxGa1–xAs hetero-epitaxial layers (ECS Journal of Solid State Science and Technology (2020) 9 (033001) DOI: 10.1149/2162-8777/ab74c7)

  • C. Claeys
  • , P. C. Hsu
  • , Y. Mols
  • , H. Han
  • , H. Bender
  • , F. Seidel
  • , P. Carolan
  • , C. Merckling
  • , A. Alian
  • , N. Waldron
  • , G. Eneman
  • , N. Collaert
  • , M. Heyns
  • , E. Simoen

Research output: Contribution to journalComment/Debate

Abstract

In the course of the production process, typographical errors were introduced in Eqs. 5, 6a and 6b of this paper. They are corrected below. On page 2, Eq. 5 should read as follows: qni(x, T)sn,pnthn,p Idefect = [5] 2 cosh (ET(x) - Ei(x)) kBT Equation 6a should read: Idefect = qni(x, T)sn,pnthn,p/2 [6a] Equation 6b should read: qni(x, T)sn,pnthn,p Idefect = [6b] exp (∣ET(x) - Ei(x)∣) kBT The publisher apologizes for any inconvenience caused.

Original languageEnglish
Article number039002
JournalECS Journal of Solid State Science and Technology
Volume9
Issue number3
DOIs
Publication statusPublished - 4 Mar 2020
Externally publishedYes

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