TY - CHAP
T1 - Evaluation of chip-to-board interconnection using variable aspect ratio contact pad areas
AU - Jesudoss, Pio
AU - Mathewson, Alan
AU - Wright, William
AU - Stam, Frank
PY - 2008
Y1 - 2008
N2 - This paper describes the evaluation of chip-to-board interconnection for low I/O sensor attachment. In particular the interconnections of different chip and printed circuit board (PCB) pad size ratios with offsets were investigated. Initial assemblies were made using lead-free, 99.3Sn0.7Cu solder. Solder joint shape prediction software, "surface evolver", has been used to simulate the solder joint shape formation for different ratio chip-to-board bond pad areas with different offsets between the two surfaces during the interconnection. The preliminary results show that depending on the solder volume and the aspect ratio of the chip-to-board pads, a convex or concave curvature of the solder joint is observed. Further simulation suggests the pad size plays a major role in the shape of the considered joints.
AB - This paper describes the evaluation of chip-to-board interconnection for low I/O sensor attachment. In particular the interconnections of different chip and printed circuit board (PCB) pad size ratios with offsets were investigated. Initial assemblies were made using lead-free, 99.3Sn0.7Cu solder. Solder joint shape prediction software, "surface evolver", has been used to simulate the solder joint shape formation for different ratio chip-to-board bond pad areas with different offsets between the two surfaces during the interconnection. The preliminary results show that depending on the solder volume and the aspect ratio of the chip-to-board pads, a convex or concave curvature of the solder joint is observed. Further simulation suggests the pad size plays a major role in the shape of the considered joints.
UR - https://www.scopus.com/pages/publications/51749122436
U2 - 10.1109/ICMEL.2008.4559348
DO - 10.1109/ICMEL.2008.4559348
M3 - Chapter
AN - SCOPUS:51749122436
SN - 9781424418824
T3 - "2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"
SP - 565
EP - 568
BT - 2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008
T2 - 26th International Conference on Microelectronics, MIEL 2008
Y2 - 11 May 2008 through 14 May 2008
ER -