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Experimental, analytical, and finite element analyses of nanoindentation of multilayer PZT/Pt/SiO
2
thin film systems on silicon wafers
C. Chima-Okereke
, A. J. Bushby
, M. J. Reece
, R. W. Whatmore
, Q. Zhang
Tyndall Micronano Electronics
Queen Mary University of London
Cranfield University
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Dive into the research topics of 'Experimental, analytical, and finite element analyses of nanoindentation of multilayer PZT/Pt/SiO
2
thin film systems on silicon wafers'. Together they form a unique fingerprint.
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Engineering
Finite Element Analysis
100%
Thin Films
100%
Silicon Wafer
100%
Silicon Dioxide
100%
Titanate
100%
Lead Zirconate
100%
Good Agreement
16%
Silicon Substrate
16%
Deconvolution
16%
Indentation
16%
Modulus of Elasticity
16%
Finite Element Modeling
16%
Sio2 Film
16%
Microelectromechanical System Design
16%
Material Science
Finite Element Method
100%
Thin Films
100%
Silicon Wafer
100%
Nanoindentation
100%
Lead Zirconate Titanate
100%
Film
33%
Silicon
16%
Elastic Property
16%
Finite Element Modeling
16%
Film Thickness
16%
Indentation
16%
Elastic Moduli
16%
Microelectromechanical System Design
16%