Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

Diarmuid McCarthy; Mike O'Shea; Russell Duane; Kevin McCarthy; Ann Concannon; Alan Mathewson

Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

Diarmuid McCarthy
, Mike O'Shea
, Russell Duane
, Kevin McCarthy
, Ann Concannon
, Alan Mathewson

Research output: Contribution to conference › Paper › peer-review

Abstract

A novel measurement technique using a new test structure is applied to the existing subthreshold methodology to extract coupling coefficients of the Top-Floating-Gate (TFG) cell. Results validate the use of the new contacted-TFG device for extracting the coupling ratios of the TFG cell design.

Original language	English
Pages	139-144
Number of pages	6
Publication status	Published - 2002
Event	Proceedings of The 2002 International Conference on Microelectronic Test Structures - Cork, Ireland Duration: 8 Apr 2002 → 11 Apr 2002

Conference

Conference	Proceedings of The 2002 International Conference on Microelectronic Test Structures
Country/Territory	Ireland
City	Cork
Period	8/04/02 → 11/04/02

Cite this

@conference{2d4bb4b3909b4b8b9b6260cab8ea8541,

title = "Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell",

abstract = "A novel measurement technique using a new test structure is applied to the existing subthreshold methodology to extract coupling coefficients of the Top-Floating-Gate (TFG) cell. Results validate the use of the new contacted-TFG device for extracting the coupling ratios of the TFG cell design.",

author = "Diarmuid McCarthy and Mike O'Shea and Russell Duane and Kevin McCarthy and Ann Concannon and Alan Mathewson",

year = "2002",

language = "English",

pages = "139--144",

note = "Proceedings of The 2002 International Conference on Microelectronic Test Structures ; Conference date: 08-04-2002 Through 11-04-2002",

}

TY - CONF

T1 - Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

AU - McCarthy, Diarmuid

AU - O'Shea, Mike

AU - Duane, Russell

AU - McCarthy, Kevin

AU - Concannon, Ann

AU - Mathewson, Alan

PY - 2002

Y1 - 2002

N2 - A novel measurement technique using a new test structure is applied to the existing subthreshold methodology to extract coupling coefficients of the Top-Floating-Gate (TFG) cell. Results validate the use of the new contacted-TFG device for extracting the coupling ratios of the TFG cell design.

AB - A novel measurement technique using a new test structure is applied to the existing subthreshold methodology to extract coupling coefficients of the Top-Floating-Gate (TFG) cell. Results validate the use of the new contacted-TFG device for extracting the coupling ratios of the TFG cell design.

UR - https://www.scopus.com/pages/publications/0037772188

M3 - Paper

AN - SCOPUS:0037772188

SP - 139

EP - 144

T2 - Proceedings of The 2002 International Conference on Microelectronic Test Structures

Y2 - 8 April 2002 through 11 April 2002

ER -

Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

Abstract

Conference

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