@article{c06d805f72cd43ec85416e321c4c1c9e,
title = "Fabrication and Characterisation of Silicide/3C-SiC/Si Contacts for Schottky Barrier Diode Application",
keywords = "Materials science, Schottky barrier, Schottky diode, Optoelectronics, Silicide, Silicon carbide, Epitaxy, Fabrication, Chemical vapor deposition, Metalsemiconductor junction, Silicon, Diode, Nanotechnology, Metallurgy, Layer (electronics), Medicine, Alternative medicine, Pathology",
author = "Russell Duane",
year = "2020",
doi = "10.1149/ma2020-01231334mtgabs",
language = "English",
journal = "Meeting Abstracts",
issn = "1091-8213",
}