Abstract
This article describes a fabrication process for GaN based resonant cavity (RC) LEDs. The devices emit through the transparent sapphire substrate. An AlGaN/GaN DBR forms the bottom mirror, while a PdAg-based p-contact metallisation serves as top mirror. The PdAg mirrors have been characterized optically by reflectometry, and electrically by circular TLM measurements. A specific contact resistivity of 1.0 × 10-2 Ωcm2 has been measured, without any annealing of the contacts. For the GaN to PdAg interface a reflectivity of 60% has been measured for a wavelength of 510 nm. At 20 mA bias the RC-LEDs show a forward voltage of 3.5 V and an optical output of 330 μW through the back of the wafer.
| Original language | English |
|---|---|
| Pages (from-to) | 348-353 |
| Number of pages | 6 |
| Journal | Physica Status Solidi (A) Applied Research |
| Volume | 192 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Aug 2002 |
| Event | 4th International Symposium on Blue Lasers and Light Emitting Diodes (ISBLLED-2002) - Cordoba, Spain Duration: 11 Mar 2002 → 15 Mar 2002 |