Fabrication of GaN-based resonant cavity LEDs

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Abstract

This article describes a fabrication process for GaN based resonant cavity (RC) LEDs. The devices emit through the transparent sapphire substrate. An AlGaN/GaN DBR forms the bottom mirror, while a PdAg-based p-contact metallisation serves as top mirror. The PdAg mirrors have been characterized optically by reflectometry, and electrically by circular TLM measurements. A specific contact resistivity of 1.0 × 10-2 Ωcm2 has been measured, without any annealing of the contacts. For the GaN to PdAg interface a reflectivity of 60% has been measured for a wavelength of 510 nm. At 20 mA bias the RC-LEDs show a forward voltage of 3.5 V and an optical output of 330 μW through the back of the wafer.

Original languageEnglish
Pages (from-to)348-353
Number of pages6
JournalPhysica Status Solidi (A) Applied Research
Volume192
Issue number2
DOIs
Publication statusPublished - Aug 2002
Event4th International Symposium on Blue Lasers and Light Emitting Diodes (ISBLLED-2002) - Cordoba, Spain
Duration: 11 Mar 200215 Mar 2002

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