@inproceedings{90303a26d4ee4e3ab2db3cae733e73ce,
title = "Failure Analysis of Large Area Pt/HfO2/Pt Capacitors Using Multilayer Perceptrons",
keywords = "Mim, Dielectric breakdown, Neural networks, Perceptron, Reliability, Spatial statistics",
author = "J. Munoz-Gorriz and S. Monaghan and K. Cherkaoui and J. Sune and Hurley, \{P. K.\} and E. Miranda",
year = "2021",
doi = "10.1109/IPFA53173.2021.9617281",
language = "English",
booktitle = "2021 Ieee International Symposium On The Physical And Failure Analysis Of Integrated Circuits (ipfa)",
}