Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	IEEE Transactions on Device and Materials Reliability
DOIs	https://doi.org/10.1109/TDMR.2014.2369377
Publication status	Published - 2014

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title = "Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions",

author = "Ailbe O'Manachain",

year = "2014",

doi = "10.1109/TDMR.2014.2369377",

language = "Undefined/Unknown",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions

AU - O'Manachain, Ailbe

PY - 2014

Y1 - 2014

U2 - 10.1109/TDMR.2014.2369377

DO - 10.1109/TDMR.2014.2369377

M3 - Article

SN - 1530-4388

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

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