Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	IEEE Transactions on Device and Materials Reliability
Publication status	Published - 2014

Cite this

@article{e725ca879f43425d91beb19f007de324,

title = "Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions",

author = "Mas, \{Xavier Saura\} and Scott Monaghan and Hurley, \{Paul K\} and Jordi Sune and Enrique Miranda",

year = "2014",

language = "Undefined/Unknown",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Failure analysis of MIM and MIS structures using point-to-event distance and angular probability distributions

AU - Mas, Xavier Saura

AU - Monaghan, Scott

AU - Hurley, Paul K

AU - Sune, Jordi

AU - Miranda, Enrique

PY - 2014

Y1 - 2014

M3 - Article

SN - 1530-4388

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

ER -