Far infrared reflection-absorption investigation of SnCl4 on silica and Na modified silica surfaces using the buried metal layer approach

Michael J. Pilling; Peter Gardner Nurhayati; Martyn E. Pemble; Mark Surman

doi:10.1016/S0039-6028(98)00697-9.

Far infrared reflection-absorption investigation of SnCl₄ on silica and Na modified silica surfaces using the buried metal layer approach

Michael J. Pilling
, Peter Gardner Nurhayati
, Martyn E. Pemble
, Mark Surman

University of Manchester

Research output: Contribution to journal › Article › peer-review

Abstract

Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl₄ on a thin-film silica surface. This has been made possible by growing the silica film on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. We show that reasonable S/N RAIRS spectra can be obtained in this region, even from films up to 1000 Å thick, enabling subtle details in the spectrum of the chemisorbed species to be obtained.

Original language	English
Pages (from-to)	L1-L7
Number of pages	8
Journal	Surface Science
Volume	418
Issue number	1
DOIs	https://doi.org/10.1016/S0039-6028(98)00697-9.
Publication status	Published - Jun 1998
Externally published	Yes
Event	Proceedings of the 1999 Accelerator-based Sources of Infrared and Spectroscopic Applications - Denver, CO, USA Duration: 19 Jul 1999 → 20 Jul 1999

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10.1016/S0039-6028(98)00697-9.

Cite this

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title = "Far infrared reflection-absorption investigation of SnCl4 on silica and Na modified silica surfaces using the buried metal layer approach",

abstract = "Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 on a thin-film silica surface. This has been made possible by growing the silica film on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. We show that reasonable S/N RAIRS spectra can be obtained in this region, even from films up to 1000 {\AA} thick, enabling subtle details in the spectrum of the chemisorbed species to be obtained.",

author = "Pilling, \{Michael J.\} and Nurhayati, \{Peter Gardner\} and Pemble, \{Martyn E.\} and Mark Surman",

year = "1998",

month = jun,

doi = "10.1016/S0039-6028(98)00697-9.",

language = "English",

volume = "418",

pages = "L1--L7",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier B.V.",

number = "1",

note = "Proceedings of the 1999 Accelerator-based Sources of Infrared and Spectroscopic Applications ; Conference date: 19-07-1999 Through 20-07-1999",

}

TY - JOUR

T1 - Far infrared reflection-absorption investigation of SnCl4 on silica and Na modified silica surfaces using the buried metal layer approach

AU - Pilling, Michael J.

AU - Nurhayati, Peter Gardner

AU - Pemble, Martyn E.

AU - Surman, Mark

PY - 1998/6

Y1 - 1998/6

N2 - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 on a thin-film silica surface. This has been made possible by growing the silica film on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. We show that reasonable S/N RAIRS spectra can be obtained in this region, even from films up to 1000 Å thick, enabling subtle details in the spectrum of the chemisorbed species to be obtained.

AB - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 on a thin-film silica surface. This has been made possible by growing the silica film on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. We show that reasonable S/N RAIRS spectra can be obtained in this region, even from films up to 1000 Å thick, enabling subtle details in the spectrum of the chemisorbed species to be obtained.

U2 - 10.1016/S0039-6028(98)00697-9.

DO - 10.1016/S0039-6028(98)00697-9.

M3 - Article

SN - 0039-6028

VL - 418

SP - L1-L7

JO - Surface Science

JF - Surface Science

IS - 1

T2 - Proceedings of the 1999 Accelerator-based Sources of Infrared and Spectroscopic Applications

Y2 - 19 July 1999 through 20 July 1999

ER -

Far infrared reflection-absorption investigation of SnCl4 on silica and Na modified silica surfaces using the buried metal layer approach

Abstract

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Far infrared reflection-absorption investigation of SnCl₄ on silica and Na modified silica surfaces using the buried metal layer approach