TY - JOUR
T1 - Fast Growth of Smooth AlN in a 3 × 2″ Showerhead-Type Vertical Flow MOVPE Reactor
AU - Zubialevich, Vitaly Z.
AU - Pampili, Pietro
AU - Parbrook, Peter J.
N1 - Publisher Copyright:
© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
PY - 2018/5
Y1 - 2018/5
N2 - The conditions required for a high growth rate of AlN in a 3 × 2″ showerhead-type vertical flow metalorganic vapor phase epitaxy (MOVPE) reactor are studied. It is found that at the standard growth conditions (low V/III, 50 mbar, 1110 °C, H2), the growth rate linearly increases with the trimethylaluminium (TMAl) flow rate until about 280 μmol min−1 with some drop of precursor utilization efficiency at higher pressures. While the pre-reaction of TMAl with NH3 at 140 μmol min−1 of TMAl is still not a major issue, it is not possible, however, to maintain a smooth AlN surface morphology during this “fast” growth. To suppress the surface morphology deterioration, the growth pressure requires optimization. An increase of the growth pressure, to 75 mbar, is found to be critical to grow 20+ μm of smooth AlN at a rate of about 3.6 μm h−1 on bulk AlN substrates.
AB - The conditions required for a high growth rate of AlN in a 3 × 2″ showerhead-type vertical flow metalorganic vapor phase epitaxy (MOVPE) reactor are studied. It is found that at the standard growth conditions (low V/III, 50 mbar, 1110 °C, H2), the growth rate linearly increases with the trimethylaluminium (TMAl) flow rate until about 280 μmol min−1 with some drop of precursor utilization efficiency at higher pressures. While the pre-reaction of TMAl with NH3 at 140 μmol min−1 of TMAl is still not a major issue, it is not possible, however, to maintain a smooth AlN surface morphology during this “fast” growth. To suppress the surface morphology deterioration, the growth pressure requires optimization. An increase of the growth pressure, to 75 mbar, is found to be critical to grow 20+ μm of smooth AlN at a rate of about 3.6 μm h−1 on bulk AlN substrates.
KW - AlN
KW - crystal growth
KW - III-nitride semiconductors
KW - MOCVD
KW - MOVPE
KW - surface morphology
UR - https://www.scopus.com/pages/publications/85040164366
U2 - 10.1002/pssb.201700472
DO - 10.1002/pssb.201700472
M3 - Article
AN - SCOPUS:85040164366
SN - 0370-1972
VL - 255
JO - Physica Status Solidi (B): Basic Research
JF - Physica Status Solidi (B): Basic Research
IS - 5
M1 - 1700472
ER -