Fast shuttling of a trapped ion in the presence of noise

  • Xiao Jing Lu
  • , J. G. Muga
  • , Xi Chen
  • , U. G. Poschinger
  • , F. Schmidt-Kaler
  • , A. Ruschhaupt

Research output: Contribution to journalArticlepeer-review

Abstract

We theoretically investigate the motional excitation of a single ion caused by spring-constant and position fluctuations of a harmonic trap during trap shuttling processes. A detailed study of the sensitivity on noise for several transport protocols and noise spectra is provided. The effect of slow spring-constant drifts is also analyzed. Trap trajectories that minimize the excitation are designed combining invariant-based inverse engineering, perturbation theory, and optimal control.

Original languageEnglish
Article number063414
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume89
Issue number6
DOIs
Publication statusPublished - 18 Jun 2014

Fingerprint

Dive into the research topics of 'Fast shuttling of a trapped ion in the presence of noise'. Together they form a unique fingerprint.

Cite this