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First principles modeling of defects in the Al
2
O
3
/In
0.53
Ga
0.47
As system
Gabriel Greene-Diniz
, Kelin J. Kuhn
,
Paul K. Hurley
, James C. Greer
Tyndall
Tyndall MicroNano Systems
Tyndall Photonics
School of Chemistry
University College Cork
Cornell University
Research output
:
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›
peer-review
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Dive into the research topics of 'First principles modeling of defects in the Al
2
O
3
/In
0.53
Ga
0.47
As system'. Together they form a unique fingerprint.
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Engineering
Gallium Arsenide
100%
Energy Transition
66%
Valence Band
66%
Band Gap
33%
Broadening
33%
Monolayer
33%
Alloying
33%
Band Edge
33%
Electrical Measurement
33%
Energy State
33%
Combined Effect
33%
Growth Condition
33%
Sublattice
33%
Formation Energy
33%
Metal Oxide Semiconductor
33%
Oxide Semiconductor
33%
Interfacial Layer
33%
Chemical Environment
33%
Physics
Energy Gaps (Solid State)
100%
Density Functional Theory
100%
First Principle
100%
Alloying
100%
Metal Oxide Semiconductor
100%
Point Defect
100%
Perturbation Theory
100%
Material Science
Aluminum Oxide
100%
Gallium Arsenide
100%
Density
66%
Oxide Semiconductor
66%
Surface (Surface Science)
33%
Monolayer
33%
Metal Oxide
33%
Alloying
33%
Capacitance
33%
Capacitor
33%
Point Defect
33%